Repeat Measurements and Metrics for Nonlinear Model Development

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Date: 2007-10-16 15:17:08 Measurement Compact Software Artificial neural network Accuracy and precision Statistics Thought Neural networks		Repeat Measurements and Metrics for Nonlinear Model Development Add to Reading List Source URL: www.eeel.nist.gov Download Document from Source Website File Size: 155,89 KB Share Document on Facebook