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Computer hardware / Dynamic random-access memory / Random-access memory / CMOS / Electronic circuit / Very-large-scale integration / Static random-access memory / Nano-RAM / Computer memory / Electronics / Electronic engineering


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Document Date: 2011-02-27 16:38:21

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USD / AMD / /

Facility

University of Minnesota / /

IndustryTerm

large-area electronics / p-type read device / p-type devices / silicon chips / array chip / electronic flexible systems / inkjet printing / manufacturing / printing method / test chip / low-temperature processing / good n-type device / /

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National Science Foundation / University of Minnesota / Minneapolis / /

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Ion-Gel Gated Transistors / /

ProgrammingLanguage

DC / /

ProvinceOrState

Minnesota / /

PublishedMedium

Advanced Functional Materials / /

TVStation

WBL / /

Technology

organic DRAM array chip / OTFT technologies / SRAM / 8×8 DRAM test chip / OTFT technology / silicon chips / /

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