Channel Models for Multi-Level Cell Flash Memories Based on Empirical Error Analysis Veeresh Taranalli, Hironori Uchikawa and Paul H. Siegel I. INTRODUCTION Channel modeling for NAND flash memories is a developing resear

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Date: 2017-10-20 12:24:18		Channel Models for Multi-Level Cell Flash Memories Based on Empirical Error Analysis Veeresh Taranalli, Hironori Uchikawa and Paul H. Siegel I. INTRODUCTION Channel modeling for NAND flash memories is a developing resear Add to Reading List Source URL: cmrr.ucsd.edu Download Document from Source Website File Size: 850,13 KB Share Document on Facebook