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31	PDF Document Add to Reading List Source URL: www.samaa.org.za Language: English - Date: 2016-02-24 01:17:34 Aviation Business Economy Model aircraft Air show Airport Park flyer Flight test Airfield traffic pattern Pilot
32	Chapter 6 Conclusions and Recommendations In this research project, the GIS software, ArcView was connected to the USEPA water quality model, WASP5. The study area utilized as a test case for this linkage was the Upper H Add to Reading List Source URL: www.ce.utexas.edu Language: English - Date: 1996-08-20 20:23:00 Water GIS software Hydrology Water pollution Software Hydraulic engineering Physical geography Geographic information system Environmental soil science ArcInfo
33	Chapter 8 The “New Psychometrics” – Item Response Theory Classical test theory is concerned with the reliability of a test and assumes that the items Add to Reading List Source URL: personality-project.org Language: English - Date: 2011-08-17 18:37:06 Statistics Psychometrics Statistical models Education Psychology Educational psychology Rasch model Questionnaire construction Item response theory Educational research Logistic function Scale
34	SAMJA Turbine Proficiency Rating The emphasis of the SAMJA Turbine Proficiency Rating is on the SAFE operation of turbine powered aircraft. Both safe turbine operation and safe flying skills are required to qualify for t Add to Reading List Source URL: www.samaa.org.za Language: English - Date: 2016-05-25 05:42:37 Aviation safety Aviation Model aircraft Flight test Hot start Jet engines Business Aeronautics Turbines
35	Technical Note: Analyzing land cover change with logistic regression in R D G Rossiter∗ Analía Loza† Version 2.4; May 14, 2016 Add to Reading List Source URL: www.css.cornell.edu Language: English - Date: 2016-05-14 10:53:21 Statistics Regression analysis Estimation theory Actuarial science Statistical models Parametric statistics Logistic regression Linear regression Categorical variable Generalized linear model Omnibus test
36	MODEL SR830 DSP Lock-In Amplifier 1290-D Reamwood Avenue Sunnyvale, CaliforniaPhone: ( • Fax: ( Add to Reading List Source URL: www.thinksrs.com Language: English - Date: 2015-08-28 18:13:45 Electronic engineering Electronics Electronic circuits Electromagnetism Integrated circuits Electronic test equipment Laboratory equipment Amplifier Operational amplifier Analog-to-digital converter Power supply Lock-in amplifier
37	Why NRMSE is not completly reliable for forecast/hindcast model test performances Add to Reading List Source URL: www.waveworkshop.org Language: English - Date: 2013-11-01 08:27:22 Statistics Data analysis Measurement Estimation theory Mean squared error Errors and residuals Root-mean-square deviation
38	Paper 287 Fitting Nonlinear Mixed Models with the New NLMIXED Procedure Russell D. Wolfinger, SAS Institute Inc., Cary, NC ABSTRACT Add to Reading List Source URL: www.ats.ucla.edu Language: English - Date: 2016-08-17 18:18:26 Statistics Regression analysis Estimation theory Statistical theory Analysis of variance Statistical methods Generalized linear mixed model Mixed model Restricted maximum likelihood Generalized estimating equation Least squares Likelihood-ratio test
39	Ultra Stable Surface DC Voltmeter Model USSVM2 Instructions Overview: The Ultra Stable Surface Voltmeter 2, utilizes a sensor shutter/switcher technology which provides long term stability without drift or the need to fr Add to Reading List Source URL: www.trifield.com Language: English - Date: 2015-03-16 14:00:21 Electromagnetism Electronic test equipment Electricity Measuring instruments Force Electrostatic voltmeter USB Ammeter Voltmeter Voltage Battery Laptop
40	2015 20th IEEE European Test Symposium (ETS) ! New Drain Current Model for Nano-Meter MOS Transistors On-Chip Threshold Voltage Test Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-08-06 17:54:54 Electronic engineering Electrical engineering Electromagnetism Integrated circuits Semiconductor devices Electronic design Logic families Electronic circuits MOSFET Drain-induced barrier lowering CMOS Threshold voltage

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