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	Comprehensive Simulation Study of Statistical Variability in 32nm SOI MOSFET N. M. Idris1, B. Cheng1, A. R. Brown1, S. Markov1, and A. Asenov1,2 School of Engineering, University Of Glasgow, Glasgow, G12 8LT, Scotland, U Add to Reading List Document Date: 2010-12-10 06:55:44 Open Document File Size: 892,98 KB Share Result on Facebook

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Comprehensive Simulation Study of Statistical Variability in 32nm SOI MOSFET N. M. Idris1, B. Cheng1, A. R. Brown1, S. Markov1, and A. Asenov1,2 School of Engineering, University Of Glasgow, Glasgow, G12 8LT, Scotland, UAdd to Reading List