Microscopy

Results: 4250



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51

Microscopy-Today, Vol), PgeThe Scanning Confocal Electron Microscope Nestor J. Zaluzec Materials Science Division, Electron Microscopy Center

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Source URL: 146.139.72.10

Language: English - Date: 2004-10-14 12:22:02
    52

    Microscopy Imaging Center (MIC) Faculty of Medicine VetSuisse Faculty Faculty of Science

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    Source URL: www.mic.unibe.ch

    Language: English - Date: 2017-10-30 05:02:51
      53

      A short tutorial on the possibilities and future perspectives of electron microscopy techniques to measure particle number size distributions of nanomaterials. Ralf Kaegi Nanotechnology (NT) is the art, science and engin

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      Source URL: www.nanodefine.eu

      Language: English - Date: 2015-10-23 12:05:09
        54

        Highly efficient plasmonic tip design for plasmon nanofocusing in near-field optical microscopy

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        Source URL: naspec.ap.eng.osaka-u.ac.jp

        Language: English - Date: 2016-03-03 19:10:21
          55

          SUBJECT AREAS: NEUROSCIENCE MULTIPHOTON MICROSCOPY DIODE LASERS FLUORESCENCE IMAGING

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          Source URL: j-photonics.org

          Language: English - Date: 2017-11-17 00:12:01
            56

            2013 年度日本顕微鏡学会電子顕微鏡二級技士技術認定試験問題 問 1 .大きさの順で正しいのはどれか. 問 9 .動物組織の固定で正しいのはどれか. 1.大腸菌<ウ

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            Source URL: microscopy.or.jp

            Language: Japanese - Date: 2017-04-17 21:17:31
              57

              SYMMETRY-BASED MITOSIS DETECTION IN TIME-LAPSE MICROSCOPY Topaz Gilad  Mark-Anthony Bray†

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              Source URL: www.ee.bgu.ac.il

              Language: English - Date: 2015-11-04 03:04:07
                58

                Comparison of SCEM and STEM-HAADF Imaging in Thick Specimens Nestor J. Zaluzec, Jon Hiller Electron Microscopy Center, Argonne National Laboratory, Argonne, IL, USAThe Scanning Confocal Electron Microscope has bee

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                Source URL: www.amc.anl.gov

                Language: English - Date: 2005-02-12 22:03:00
                  59

                  Microscopy Imaging Center (MIC) MIC Workshop: Recording and Analyzing Calcium Signals with LaserScanning Confocal Microscopy

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                  Source URL: www.mic.unibe.ch

                  Language: English - Date: 2017-08-08 05:15:14
                    60

                    WEEE Policy Andor Technology produces  Digital Cameras and accessories  Spectrographs and accessories  Microscopy systems and accessories This equipment is classified as category 9 equipment ‘Monitoring and Co

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                    Source URL: www.andor.com

                    Language: English - Date: 2017-02-28 04:36:57
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