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NANOSCOPY Scanning Probe Microscopes for extreme Environments Tuning Fork based AFM Measurements of uncapped, stacked InAs Quantum Dots in a GaAs matrix.
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Document Date: 2014-02-03 00:20:42
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NANOSCOPY Scanning Probe Microscopes for extreme Environments Tuning Fork based AFM Measurements of uncapped, stacked InAs Quantum Dots in a GaAs matrix.