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Electronic design automation / Single event upset / Electronic design / Soft error / Fault injection / Scan chain / Reliability engineering / Microprocessor / Logic simulation / Electronic engineering / Digital electronics / Electronics
Date: 2001-06-07 17:50:05
Electronic design automation
Single event upset
Electronic design
Soft error
Fault injection
Scan chain
Reliability engineering
Microprocessor
Logic simulation
Electronic engineering
Digital electronics
Electronics

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