SHRIMP II Sensitive High Resolution Ion Microprobe w o d

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Date: 2013-04-16 05:13:56 Laboratory techniques Sensitive high-resolution ion microprobe Secondary ion mass spectrometry Inductively coupled plasma mass spectrometry Sector instrument Apple IIe Ion source Isotope analysis Analyser Chemistry Mass spectrometry Scientific method		SHRIMP II Sensitive High Resolution Ion Microprobe w o d Add to Reading List Source URL: www.asi-pl.com.au Download Document from Source Website File Size: 3,98 MB Share Document on Facebook

	Mineralogical Society of Great Britain and Ireland Postgraduate Student Bursary Report 2012 SHRIMP dating, Geological Survey of Canada, Otta DocID: 15Hjn - View Document
	BOOK REVIEWS SECONDARY ION MASS SPECTROMETRY IN THE EARTH SCIENCES* The Mineralogical Association of Canada Short Course Series Volume 41, Secondary Ion Mass Spectrometry in the Earth Sciences – Gleaning the DocID: 147n0 - View Document
	SIMS – Basic Concepts & Design The Basics Secondary Ion Mass Spectrometry (SIMS), also known as the ion probe, is a ‘destructive’ analytical technique. This means that part of the sample is physically removed by th DocID: ZLsH - View Document
	SHRIMP II Facility U-Th-Pb and trace element analysis U-Th-Pb analysis The Primary use of the SHRIMP II facility is the U-Pb analysis of zircon and other minerals. Zircon and other U-bearing minerals such as monazite, xe DocID: ZC4q - View Document
	ANU SHRIMP PUBLICATIONS: [removed]Updated 27 February[removed]Clement, S.W., Compston, W. and Newstead, G., 1977. Design of a large, high resolution ion microprobe. Proceedings of the First International Conferenc DocID: YTzo - View Document