Microsoft Word[removed]doc

First Page		Document Content
Date: 2013-11-21 07:46:00 Engineering ISO/IEC 17025 Quality control Calibration Accreditation Mitutoyo Measurement uncertainty Micrometer Measurement Technology Metrology		Microsoft Word[removed]doc Add to Reading List Source URL: www.pmcxyz.com Download Document from Source Website File Size: 510,01 KB Share Document on Facebook

	WP20: FutureJet –Cryogenic Jets of Nano- and Micrometer-Sized Particles for Hadron Physics HadronPhysics3: DocID: 1urtP - View Document
	Soft X-Ray Lithography for High-Aspect Ratio Sub-Micrometer Structures S. Lemkea, J. Goettertb*, T. Holubeka, B. Löchela, I. Rudolpha and T. Seligera a Helmholtz-Zentrum Berlin (HZB) für Materialien und Energie GmbH, DocID: 1s9p8 - View Document
	Calibration of Microscope/Objectives/Camera DocID: 1rsxu - View Document
	S ME G a u ge for C a l en d ered Web Th i ckn ess P rofi l e Th e n o n -n u c l e a r s o l u ti o n The FACTS SME Gauge is THE non-nuclear solution for calendered web thickness measurement. DocID: 1r7LM - View Document
	Meteoritics & Planetary Science 44, Nr 7, 1033–Abstract available online at http://meteoritics.org The use of Auger spectroscopy for the in situ elemental characterization of sub-micrometer presolar grains DocID: 1r1qX - View Document