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Wavelet / Reflectivity / Scientific method / X-ray reflectivity / Science / Mexican hat wavelet / Mathematical analysis / Functional analysis / Numerical analysis


Surface and Interface 16A1/2002S2003 Analysis of X-ray reflectivity from sputtered carbon thin films (2) Wavelet transform analysis
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Document Date: 2010-01-05 10:30:34

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Facility

National Institute / /

IndustryTerm

unknown chemical and physical properties / /

Organization

National Institute for Materials Science / /

Person

S. Takahashi / /

Technology

X-ray / /

SocialTag