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Nanomaterials / Electronic engineering / MOSFET / Self-aligned gate / Threshold voltage / Gate oxide / Field-effect transistor / Transistor / Nanocrystal / Electrical engineering / Semiconductor devices / Technology


APPLIED PHYSICS LETTERS VOLUME 79, NUMBER 3 16 JULY 2001
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Document Date: 2007-07-14 19:24:15

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File Size: 123,44 KB

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