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![]() Date: 2014-12-09 06:32:55Empa Laboratories Photoluminescence Dübendorf Carrier lifetime CZTS Physics Science Luminescence Spectroscopy Chemistry | Add to Reading List |
![]() | OCVD 法によるダイヤモンド p-i-n ダイオードのキャリア寿命測定 Carrier lifetime in diamond p-i-n diode by Open Circuit Voltage Decay method (OCVD) ○ A. Traore1, A. Nakajima1, T. Makino1, D. KuwabaDocID: 1uT58 - View Document |
![]() | SIXTH FRAMEWORK PROGRAMMEDocID: 19y9U - View Document |
![]() | Applications of Microwave Reflectance Methods to the study of Silicon (Photo)electrochemistry in Fluoride Solutions Michael Cass1, Noel Duffy2 Khaled Kirah3, Laurence.Peter2, Stephen Pennock4, Shin Ushiroda2and Alison WaDocID: 12SoO - View Document |
![]() | THE VALIDITY OF CHARGE EXTRACTION IN P3HT:PCBM SOLAR CELLSDocID: 12JNO - View Document |
![]() | IEEE JOURNAL OF QUANTUM ELECTRONICS, VOL. 47, NO. 12, DECEMBER[removed]Circuit Modeling of Carrier–Photon Dynamics in Composite-Resonator Vertical-Cavity LasersDocID: LYNb - View Document |