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Characterization of CZT Crystals with Using of the Time-of-Flight Method V. Ivanov, L. Alekseeva, P. Dorogov, A. Loutchanski RITEC Ltd. 23 Aizkraukles St. office 407, Riga, LV-1006, Latvia Tel./Fax: +, E-mail:
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Document Date: 2013-12-27 11:15:56
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Characterization of CZT Crystals with Using of the Time-of-Flight Method V. Ivanov, L. Alekseeva, P. Dorogov, A. Loutchanski RITEC Ltd. 23 Aizkraukles St. office 407, Riga, LV-1006, Latvia Tel./Fax: +, E-mail: