Lancaster / Washington D.C. / Budapest / S. Microstructure / Leipzig / Weinheim / Berlin / Hagendorf / Hamsphire / Aachen / Graz / St. Louis / Amsterdam / /
Company
Wiley-VCH Verlag & Co. KGaA / Cambridge University Press / Kraft / Kendall / Y. Ab / Elsevier BV / DEStech Publications Inc. / J.D.D. / C.L. Ab / epitaxial Ag / Ge / /
Continent
Europe / /
Country
United States / United Kingdom / Malta / Schweiz / /
Currency
pence / /
Facility
University of Manchester / Jakes P. Influence / Institute of Electrical / Photovoltaic Specialists Conference PVSC Institute of Electrical / /
IndustryTerm
stacked-die technology / steel grade / Online-Magazin / photon management / silicon chips / minority carrier lifetimes / multi-functional aerospace applications / carrier decay time / photoluminescence imaging / metal ions / imaging / photovoltaic applications / metal / power applications / phonon energy / eWLB metal contacts / solar cell applications / cluster-beam-deposited metal particles / multifunctional applications / failure analysis applications / manufacturing / carrier-lifetime measurement methods / aqueous solutions / light management / polymer metal components / ov excess charge carrier lifetime / /
Organization
Institute of Electrical / Cambridge University / European Mechanics Society / Lab on a Chip / American Ceramic Society / Technische Universität / Tagungsband National Agency for Finite Element Methods / ET Foundation / European Society for Composite Materials / International Society for Optics / American Chemical Society / Congress / Technische Universität Graz / Technische Universität Wien / German Society for Electron Microscopy Kiel / University of Manchester / Universität Padua / European Union / Institut für Print / /
Person
Van Ngo / V / Imam Khasim / Naumann / V / Crystal Growth / / /
V e r ö ff e n t l i c h u n g e n i n r e f e r i e r t e n Z e i t s c h r i f t e n Aabdin, Z.; Peranio, N.; Eibl, O.; Töllner, W.; Nielsch, K.; Bessas, D.; Hermann, R.P.; Winkler, M.; König, J.; Böttner, H.; Pach