Stochastic Analysis on RAID Reliability for Solid-State Drives arXiv:1304.1863v1 [cs.PF] 6 Apr 2013 Yongkun Li, Patrick P. C. Lee, John C. S. Lui The Chinese University of Hong Kong - John C.S. Lui - Document - PDFSEARCH.IO

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	Stochastic Analysis on RAID Reliability for Solid-State Drives arXiv:1304.1863v1 [cs.PF] 6 Apr 2013 Yongkun Li, Patrick P. C. Lee, John C. S. Lui The Chinese University of Hong Kong Add to Reading List Document Date: 2013-04-08 21:14:21 Open Document File Size: 457,55 KB Share Result on Facebook

Stochastic Analysis on RAID Reliability for Solid-State Drives arXiv:1304.1863v1 [cs.PF] 6 Apr 2013 Yongkun Li, Patrick P. C. Lee, John C. S. Lui The Chinese University of Hong KongAdd to Reading List