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Matter / Metallurgy / Whisker / Electronics manufacturing / Restriction of Hazardous Substances Directive / JEDEC / Tin / Printed circuit board / Silicon carbide / Chemistry / Electronic engineering / Electromagnetism


This article is part of the Reliability Society 2010 Annual Technical Report Arcing Enabled by Tin Whiskers Brian D’Andrade, Alex Z. Kattamis, Patrick F. Murphy, John McNulty and Shukri Souri Exponent, Inc. Email: {bd
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Document Date: 2011-06-09 12:51:57


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File Size: 105,48 KB

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Company

Shukri Souri Exponent Inc. / CRC Press / Electronic Packaging Manufacturing / Raytheon / /

Continent

Europe / /

IndustryTerm

voltage electrical systems / mechanical hardware / electrical systems / risk assessment algorithm / aerospace components / /

Organization

Reliability Society / /

Person

David Pinsky / Alex Z. Kattamis / Patrick F. Murphy / John McNulty / /

Position

flat conductor / nearby flat conductor / /

Technology

risk assessment algorithm / Tin Whisker Application Specific Risk Assessment Algorithm / dielectric / /

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