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PHYSICAL REVIEW B 73, 125416 共2006兲 Infrared catastrophe and tunneling into strongly correlated electron systems: Beyond the x-ray edge limit Kelly R. Patton and Michael R. Geller Department of Physics and Astronomy
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Document Date: 2006-05-05 10:54:24


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City

Amsterdam / /

Company

vF / Research Corporation / L. L. Sohn L. P. / Luttinger / /

Country

United States / /

Currency

USD / /

Facility

University of Georgia / /

IndustryTerm

ordinary metal / power-law decay / power-law density / low energy / correlated electron systems / diffusive metal / low-energy fixed-point / host electron gas / energy dependence / 1D electron gas / interaction energy / low-energy / 3D electron gas / solvable systems / low-energy limit / time-dependent charging energy contribution / energy / /

MusicGroup

U2 / /

OperatingSystem

DOS / Fermi / /

Organization

University of Georgia / Athens / Aspen Center for Physics / National Science Foundation / Michael R. Geller Department of Physics and Astronomy / U.S. Securities and Exchange Commission / /

Person

Kelly R. Patton / Emily Pritchett / Dmitri Khveshchenko / Tei / Giovanni Vignale / Michael R. Geller / Shan-Ho Tsai / Phil Anderson / Matthew Grayson / David Thouless / Allan MacDonald / /

Position

host conductor / conductor / Fisher / Phys / model / obtaining the exact DOS exponent / /

ProvinceOrState

Georgia / /

Technology

x-ray / /

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