216 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 53, NO. 1, FEBRUARY 2004 A Sensitive Optical Polarimetric Imaging Technique for Surface Defects Detection - IEEE Instrumentation - Document - PDFSEARCH.IO

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	216 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 53, NO. 1, FEBRUARY 2004 A Sensitive Optical Polarimetric Imaging Technique for Surface Defects Detection Add to Reading List Document Date: 2010-02-04 13:04:24 Open Document File Size: 272,43 KB Share Result on Facebook

216 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 53, NO. 1, FEBRUARY 2004 A Sensitive Optical Polarimetric Imaging Technique for Surface Defects DetectionAdd to Reading List