<--- Back to Details
First PageDocument Content
Electronic engineering / High-k dielectric / American Physical Society / Herbert Kroemer / Electronics / Physics / Heterojunction
Date: 2008-09-30 11:14:29
Electronic engineering
High-k dielectric
American Physical Society
Herbert Kroemer
Electronics
Physics
Heterojunction

Microsoft Word - Document1

Add to Reading List

Source URL: www.aps.org

Download Document from Source Website

File Size: 34,64 KB

Share Document on Facebook

Similar Documents

Hydrogen in high-k dielectric oxides modelled by muonium Rui Vilao - Univ. Coimbra Following the seminal work of Cox et al. (J. Phys. Cond. Matt) on high-k dielectric oxide muonics, we discuss the electro

DocID: 1o3zp - View Document

High-k dielectric / Electromagnetism / Electronics / Electrical engineering / Semiconductor device fabrication / Wafer / Ultraviolet

F R A U N H O F E R I N S T I T U T e for I nte g rate d S y ste m s an d De v i c e T e c hno l o g y I I S B 1

DocID: 19zCS - View Document

Condensed matter physics / Environmental chemistry / Materials science / Atomic physics / High-k dielectric / Transistors / Photoemission spectroscopy / Core electron / X-ray absorption spectroscopy / Physics / Chemistry / Science

PDF Document

DocID: 1954S - View Document

Electronic engineering / Transistors / High-k dielectric / Gate dielectric / Thermal oxidation / Semiconductor device fabrication / Silicon dioxide / Polycrystalline silicon / Negative bias temperature instability / Chemistry / Electromagnetism / Electronics

Photon Factory Activity Report 2005 #23Part BSurface and Interface 4C,6A,15C/2004G059 Residual Order in the Interfacial SiO2 Layer

DocID: 18WsR - View Document

Ceramic materials / Atomic physics / Molecular physics / Spectroscopy / X-ray photoelectron spectroscopy / Silicon dioxide / Oxide / High-k dielectric / Silicide / Chemistry / Matter / Anions

Photon Factory Activity Report 2009 #27 Part BSurface and Interface 18A/2008G186 Effect of oxygen coadsorption on titanium silicide formation on Si(001)

DocID: 18UZ5 - View Document