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Electronic engineering / Electromagnetism / Electronics / Integrated circuits / Electronic design automation / Electronic design / Semiconductor device fabrication / Hardware Trojan / Automatic test pattern generation / Electromigration / Reliability engineering / Negative-bias temperature instability


Copyright © 2012 American Scientific Publishers All rights reserved Printed in the United States of America Journal of Low Power Electronics
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Document Date: 2012-11-06 11:44:32


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File Size: 2,22 MB

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