Grouper

Results: 1407



#Item
711Analog-to-digital converter / Integral nonlinearity / LTX / Differential nonlinearity / Static testing / David / Technology / Nevi\'im / Bible / Digital signal processing / Electronic circuits / Digital-to-analog converter

P1658 Digital to Analog Standard Meeting, October 16, 2007 Hosted by LTX Corporation, Norwood, MA Modified: 7-November-2007 Attendees: Steve Tilden, Texas Instruments (Chair)

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Source URL: grouper.ieee.org

Language: English - Date: 2007-11-07 21:08:21
712Manufacturing / Electronic design / Integrated circuits / Embedded systems / Joint Test Action Group / Boundary scan / Digital electronics / IC power supply pin / Integrated circuit design / Electronic engineering / Electronics / Electronics manufacturing

Implementing and Using a Mixed-Signal Test Bus Stephen Sunter [removed]

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Source URL: grouper.ieee.org

Language: English - Date: 2004-11-27 10:19:57
713Meetings / Minutes / Heiko / Computing / Database management systems / Cron

IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for December 5th, 2006 8:00 AM – 9:00 AM

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Source URL: grouper.ieee.org

Language: English - Date: 2006-12-18 21:57:20
714LTX / Meetings / Minutes / Parliamentary procedure

Minutes of 1658 Standards Committee Meeting in Colorado Springs, Colorado USA – June 15, 2006 Minutes Prepared by: Solomon Max – 2006-June[removed]July) IEEE Standard for Terminology and Test Methods for Digital-

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Source URL: grouper.ieee.org

Language: English - Date: 2006-07-17 17:41:15
715Technology / Electrical engineering / Electromagnetism / Capacitors / Energy storage / Surge protector

Meeting Minutes Capacitor Subcommittee of the Transmission and Distribution Committee Columbus, Ohio January 31, 2001

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Source URL: grouper.ieee.org

Language: English - Date: 2007-11-19 17:10:29
716Electronic engineering / IEEE Standards Association / Abbreviated Test Language for All Systems / Institute of Electrical and Electronics Engineers / International Organization for Standardization / IEEE Computer Society / Design for testing / Standards organizations / Measurement / Engineering

IEEE Standards Coordinating Committee 20: Standards for System Test A Report of the SCC20 Strategic Planning Working Group Prepared for

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Source URL: grouper.ieee.org

Language: English - Date: 1998-08-20 08:06:28
717Institute of Electrical and Electronics Engineers / Engineering / Reference / Computing / IEEE standards / Standards organizations / IEEE Standards Association

IEEE-SA Standards Board Project Authorization Request (PAR) Form[removed]Rev 1) Note: For use with help hyperlinks offline, download guide.html and parsgn99.html into the same directory. 1. Sponsor Date of Request 1999 Apr

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Source URL: grouper.ieee.org

Language: English - Date: 1999-06-29 21:53:02
718Computer hardware / Computing / Computer buses / IEEE / Video signal / Working groups / 10 Gigabit Ethernet / Power over Ethernet / Institute of Electrical and Electronics Engineers / OSI protocols / Ethernet / IEEE standards

S800baseT Meeting Minutes for July 8, 2003 Attendees: David Stone – Oxford Semi Les Baxter - Avaya Pascal Lagrange – Canon Richard Baker - TI

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Source URL: grouper.ieee.org

Language: English - Date: 2003-07-22 19:02:46
719IEEE / Video signal / Bus / Computer hardware / IEEE standards / Computer buses

Bridges Working Group May 23, 1996 San Jose, CA The meeting was called to order at 9:30 AM by Dick Scheel, the provisional chair of the working group. As is customary, the participants introduced themselves. The attendan

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Source URL: grouper.ieee.org

Language: English - Date: 1998-07-21 13:35:44
720Capacitor / Institute of Electrical and Electronics Engineers / Engineering / Technology / Standards organizations / IEEE standards / IEEE Standards Association

Microsoft Word - IEEEMIN Summer 2007.doc

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Source URL: grouper.ieee.org

Language: English - Date: 2007-07-12 10:45:16
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