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Aberration-corrected scanning transmission electron microscopy: Probing individual atoms Ondrej L. Krivanek Nion Co., Kirkland, WA, USA (www.nion.com)
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Document Date: 2011-05-19 17:42:40
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Aberration-corrected scanning transmission electron microscopy: Probing individual atoms Ondrej L. Krivanek Nion Co., Kirkland, WA, USA (www.nion.com)