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Physics / Electron microscope / Transmission electron microscopy / Nestor J. Zaluzec / Electron / Scanning transmission electron microscopy / Argonne National Laboratory / Scanning electron microscope / Transmission Electron Aberration-Corrected Microscope / Scientific method / Science / Electron microscopy


Future Science Needs and Opportunities for Electron Scattering: Next-Generation Instrumentation and Beyond
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Document Date: 2010-12-29 10:05:12


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File Size: 2,91 MB

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