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Digital electronics / Fabless semiconductor companies / Computer hardware / Altera / Field-programmable gate array / Soft error / Error detection and correction / Single event upset / Joint Test Action Group / Electronic engineering / Computer memory / Electronics
Date: 2010-07-23 20:02:22
Digital electronics
Fabless semiconductor companies
Computer hardware
Altera
Field-programmable gate array
Soft error
Error detection and correction
Single event upset
Joint Test Action Group
Electronic engineering
Computer memory
Electronics

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