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Fib
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171	Get 5 TEM sections made from your samples using FIB – ideal for orientation imaging and strain solutions at 1-5 nm resolution using ASTAR/Digistar/Topspin/Autostrain. TEM sections can be machined from the top surface o Add to Reading List Source URL: www.nanomegas.com Language: English - Date: 2014-09-02 15:58:01 Semiconductor device fabrication Thin film deposition Chemistry Transmission electron microscopy Electron microscopy Science Focused ion beam
172	ORC Postgraduate Cleanroom Course 2012 On every topic there is a 1-hour lecture (Wednesdays[removed]hrs in Mountbatten Seminar Room, [removed]and a practical demonstration session in the following 7 days. Dates and tim Add to Reading List Source URL: www.orc.soton.ac.uk Language: English - Date: 2012-02-07 09:18:19 Thin film deposition Fib Science Electron microscopy Focused ion beam Semiconductor device fabrication
173	University of Scranton ACM Student Chapter / Computing Sciences Department 12th Annual High School Programming Contest (2002) ------------------------------------------------------------------------------ Problem 1: Fib Add to Reading List Source URL: www.cs.uofs.edu Language: English - Date: 2007-08-26 21:20:40 Algebra Fibonacci number Sequence Number Integer Abstract algebra Mathematics Elementary mathematics
174	Carbonaceous material in the unique carbonaceous chondrite Miller Range 07687: A coordinated NanoSIMS, FIB-TEM, and XANES study. J. Davidson1, L. R. Nittler1, R. M. Stroud2, A. Takigawa3, C. M. O’D. Alexander1, A. L. Add to Reading List Source URL: www.nipr.ac.jp Language: English* - Date: 2014-11-16 09:41:29 Meteorite types Meteorites Space dust Chondrite Presolar grains Carbonaceous chondrite Carbonaceous XANES Silicon carbide Chemistry Science Scientific method
175	Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RB-QD04[removed] Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-12-24 00:09:04 Electron microscopy Science Physics Focused ion beam Fib Ion beam Semiconductor device fabrication Thin film deposition Scientific method
176	Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RA-QD02-0180 Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-12-24 00:09:03 Electron microscopy Physics Science Focused ion beam Fib Ion beam Semiconductor device fabrication Thin film deposition Scientific method
177	Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RA-QD02-0120 Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-12-24 00:09:04 Electron microscopy Science Physics Focused ion beam Fib Ion beam Semiconductor device fabrication Thin film deposition Scientific method
178	Stock Analysis using Fibonacci Tools Add to Reading List Source URL: www.tradecision.com Language: English - Date: 2014-01-30 03:38:22 Investment Fibonacci retracement Fibonacci Support and resistance Elliott Wave Principle Golden ratio Technical analysis Fib Fibonacci numbers Financial economics Mathematics
179	RA-QD02-0050-06_07 Curation data Status Size Transfer Category Phase Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-11-28 02:45:40 Chemistry Electron microscope Scanning electron microscope Transmission electron microscopy Microtome Epoxy Desiccator Olivine Fib Scientific method Electron microscopy Science
180	Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RB-QD04[removed] Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-12-24 00:09:03 Electron microscopy Physics Science Focused ion beam Fib Ion beam Semiconductor device fabrication Thin film deposition Scientific method

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