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Femtosecond Electron and X-ray Beam Diagnostics Using an X-band Transverse Deflector at the LCLS Yuantao Ding on behalf of C. Behrens, F.-J. Decker, J. Frisch, Z. Huang, P. Krejcik, H. Loos, T. Maxwell, J. Turner, J. Wan
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Document Date: 2013-11-22 03:11:02
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File Size: 3,90 MB
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Femtosecond Electron and X-ray Beam Diagnostics Using an X-band Transverse Deflector at the LCLS Yuantao Ding on behalf of C. Behrens, F.-J. Decker, J. Frisch, Z. Huang, P. Krejcik, H. Loos, T. Maxwell, J. Turner, J. Wan