<--- Back to Details
First PageDocument Content
Computing / Engineering / Parallel computing / Fault-tolerant computer systems / Software quality / Application checkpointing / Classes of computers / MapReduce / Computer cluster / Reliability engineering / Fault tolerance / Distributed computing
Date: 2015-11-10 08:26:34
Computing
Engineering
Parallel computing
Fault-tolerant computer systems
Software quality
Application checkpointing
Classes of computers
MapReduce
Computer cluster
Reliability engineering
Fault tolerance
Distributed computing

Cluster Fault-Tolerance: An Experimental Evaluation of Checkpointing and MapReduce through Simulation Thomas C. Bressoud #1 , Michael A. Kozuch ∗2 #

Add to Reading List

Source URL: personal.denison.edu

Download Document from Source Website

File Size: 841,03 KB

Share Document on Facebook

Similar Documents

Improving the Reliability of Commodity Operating Systems Michael M. Swift, Brian N. Bershad, and Henry M. Levy Department of Computer Science and Engineering University of Washington Seattle, WAUSA {mikesw,bershad

Improving the Reliability of Commodity Operating Systems Michael M. Swift, Brian N. Bershad, and Henry M. Levy Department of Computer Science and Engineering University of Washington Seattle, WAUSA {mikesw,bershad

DocID: 1vkXP - View Document

International Journal of Advances in Science Engineering and Technology, ISSN: Volume- 2, Issue-4, OctA STRATEGY FOR RELIABILITY EVALUATION AND FAULT DIAGNOSIS OF AUTONOMOUS UNDERWATER GLIDING ROBOT

International Journal of Advances in Science Engineering and Technology, ISSN: Volume- 2, Issue-4, OctA STRATEGY FOR RELIABILITY EVALUATION AND FAULT DIAGNOSIS OF AUTONOMOUS UNDERWATER GLIDING ROBOT

DocID: 1urDX - View Document

Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility

Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility

DocID: 1ukgt - View Document

5 Metrics You Should Know to Understand Your Engineering Efficiency Increase the speed and reliability of your team by understanding these key indicators

5 Metrics You Should Know to Understand Your Engineering Efficiency Increase the speed and reliability of your team by understanding these key indicators

DocID: 1u7ws - View Document

Practical Reliability Engineering for Semiconductor Equipment Daniel J. Weidman, Ph.D. Advanced Electron Beams, Wilmington, MA IEEE Boston-area Reliability Society Meeting

Practical Reliability Engineering for Semiconductor Equipment Daniel J. Weidman, Ph.D. Advanced Electron Beams, Wilmington, MA IEEE Boston-area Reliability Society Meeting

DocID: 1tIgr - View Document