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To appear: Proceedings of the IEEE Conference on Biometrics: Theory, Applications, and Systems, Face Recognition: Impostor-based Measures of Uniqueness and Quality Brendan F. Klare Noblis Falls Church, VA, U.S.A.
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Document Date: 2016-08-02 16:53:35
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File Size: 3,30 MB
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To appear: Proceedings of the IEEE Conference on Biometrics: Theory, Applications, and Systems, Face Recognition: Impostor-based Measures of Uniqueness and Quality Brendan F. Klare Noblis Falls Church, VA, U.S.A.