Failure rate (MTBF) 　 Device: Power Management ICs It is reported failure rate as follows. This is based on JIS-C5003. - Failure - Document - PDFSEARCH.IO

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	Failure rate (MTBF) 　 Device: Power Management ICs It is reported failure rate as follows. This is based on JIS-C5003. # Reliability result of High temperature bias test. Ta = 125℃ Add to Reading List Document Date: 2015-03-29 22:14:43 Open Document File Size: 42,46 KB Share Result on Facebook

Failure rate (MTBF) Device: Power Management ICs It is reported failure rate as follows. This is based on JIS-C5003. # Reliability result of High temperature bias test. Ta = 125℃Add to Reading List