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![]() Date: 2014-03-30 20:29:47Computer hardware MOSFET Flash memory High-k dielectric Dynamic random-access memory CMOS Soft error Reliability engineering Threshold voltage Computer memory Electronics Electronic engineering | Add to Reading List |
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![]() | A 23mW Face Recognition Accelerator in 40nm CMOS with Mostly-Read 5T Memory Dongsuk Jeon1,2, Qing Dong1, Yejoong Kim1, Xiaolong Wang3, Shuai Chen3, Hao Yu3, David Blaauw1, Dennis Sylvester1 1 University of Michigan, MI;DocID: 1vrMD - View Document |
![]() | CELL CULTURE COURSE PROGRAM September 13, 2014 08:00-08:45 Cultivation of cells, passaging, Medium Preparation and Preparation for experiments Theoretic 09:00-09:45 Cultivation of cells, passaging, Medium PreparatiDocID: 1vnJh - View Document |