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![]() Date: 2010-09-13 10:12:37Design for X Failure Materials science Reliability engineering Survival analysis Reliability United States Military Standard Quality assurance Self-aligned gate Statistics Technology Systems engineering | Add to Reading List |
![]() | SESSION IX: STATIC AND NONVOLATILE MEMORIES THAM 9.6: A 256-Bit Nonvolatile Static RAM Eli Harari, Lawrence Schmitz, Bruce Troutman and Samuel wang Hughes Aircraft Co.DocID: 1qoQu - View Document |
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![]() | Guide to the Steve Allen photographs of Fairchild Semiconductor Dates: , bulkExtent: 2 linear feet, 2 record boxes Collection number: X4360.2008 Accession number:DocID: 13bLe - View Document |
![]() | Guide to the John C. McDonald papersDocID: 12lQr - View Document |