<--- Back to Details
First PageDocument Content
IEEE Communications Society / IEEE Components /  Packaging & Manufacturing Technology Society / IEEE Reliability Society / International nongovernmental organizations / Engineering / Institute of Electrical and Electronics Engineers
Date: 2011-11-16 12:25:09
IEEE Communications Society
IEEE Components
Packaging & Manufacturing Technology Society
IEEE Reliability Society
International nongovernmental organizations
Engineering
Institute of Electrical and Electronics Engineers

IEEE Components, Packaging and Manufacturing Technology Society

Add to Reading List

Source URL: cpmt.ieee.org

Download Document from Source Website

File Size: 647,67 KB

Share Document on Facebook

Similar Documents

Practical Reliability Engineering for Semiconductor Equipment Daniel J. Weidman, Ph.D. Advanced Electron Beams, Wilmington, MA IEEE Boston-area Reliability Society Meeting

DocID: 1tIgr - View Document

Electric power / Renewable energy / Distributed generation / Static synchronous compensator / Chowdhury / Wind power / Institute of Electrical and Electronics Engineers / Microgrid / IEEE Power & Energy Society / Electric power system / Energy storage / Power electronics

Badrul H. Chowdhury Page 8 Improving Grid Reliability With Distributed Energy and Storage 90% Pmax left reference

DocID: 1plKN - View Document

IEEE Home | Search IEEE | Web Account | Shop | Contact IEEE Search IEEE RS | IEEE RS Site Map | Contact IEEE RS Useful Information Transactions on Reliability Reliability Society

DocID: 1lOFt - View Document

Roy Billinton / Institute of Electrical and Electronics Engineers / IEEE Power & Energy Society / Reliability engineering / Mohammad Shahidehpour / IEEE Smart Grid

IEEE PES Roy Billinton Power System Reliability Award This award was created is in honor of Roy Billinton, Professor Emeritus at University of Saskatchewan, Canada. Dr. Billinton

DocID: 1lKaW - View Document

IEEE Home | Search IEEE | Web Account | Shop | Contact IEEE Search IEEE RS | IEEE RS Site Map | Contact IEEE RS Useful Information Reliability Society

DocID: 1lIvI - View Document