Crystal pattern mapping can recover obliterated serial numbers in metals

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$Diffraction / Electron microscopy / Spectroscopy / Electron backscatter diffraction / Scanning electron microscope / Crystallography / Electron / Scientific method / Physics / Science$ Date: 2015-04-16 18:47:00 Diffraction Electron microscopy Spectroscopy Electron backscatter diffraction Scanning electron microscope Crystallography Electron Scientific method Physics Science		Crystal pattern mapping can recover obliterated serial numbers in metals Add to Reading List Source URL: phys.org Download Document from Source Website File Size: 37,10 KB Share Document on Facebook

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