Invitation CCD Working Group

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Date: 2005-11-02 04:28:24 Science European Commission European Union Electron beam Electron beam induced current Semiconductor device fabrication		Invitation CCD Working Group Add to Reading List Source URL: www.eubic.org Download Document from Source Website File Size: 104,99 KB Share Document on Facebook

	F R A U N H O F E R I N S T I T U T E F O R I N T E G R AT E D S Y S T E M S A N D D E V I C E T E C H N O L O G Y 1 1 DocID: 19xvD - View Document
	F r a u n h o f e r I n s t i t u t e f o r I n t e g r at e d S y s t e m s a n d D e v i c e T e c h n o l o g y 1 2 DocID: 19uSu - View Document
	CCP-EM Spring Symposium3908425Thursday 28th May 12:00 - 1:00: Registration, lunch & coffee 1:00 – 1:30: Welcome – Martyn Winn Helen Saibil – eBIC: Update on the electron bioimaging centre at Diamond DocID: 19dau - View Document
	Day 5 will take place at Department of Solid State Sciences. (www.solid.ugent.be/en/contact) Registration and financial support The number of participants is limited to 50 with a priority for PhD students. Pre-registrati DocID: 17E8t - View Document
	Ann Inst Stat Math[removed]:287–311 DOI[removed]s10463[removed]y Extended Bayesian information criterion in the Cox model with a high-dimensional feature space Shan Luo · Jinfeng Xu · Zehua Chen DocID: XKkO - View Document