Electron

Results: 11389



#Item
991High-temperature structural phase transition in Ca2Fe2O5 studied by in situ X-ray diffraction and transmission electron microscopy ∗ Hannes Kr¨ uger†‡

High-temperature structural phase transition in Ca2Fe2O5 studied by in situ X-ray diffraction and transmission electron microscopy ∗ Hannes Kr¨ uger†‡

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Source URL: pc12-c714.uibk.ac.at

Language: English - Date: 2009-05-27 08:58:49
992Arcam tillverkar produkter för industriell 3D-printing i metall. Arcams teknologi, Electron Beam Melting (EBM®), möjliggör kostnadseffektiv tillverkning av produkter med avancerad design och funktion. Arcam är en in

Arcam tillverkar produkter för industriell 3D-printing i metall. Arcams teknologi, Electron Beam Melting (EBM®), möjliggör kostnadseffektiv tillverkning av produkter med avancerad design och funktion. Arcam är en in

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Source URL: arcam.live5.client.udev.se

Language: Swedish - Date: 2015-10-12 10:43:07
    993Centre for Advanced Laser Applications Main research foci of CALA Contact:

    Centre for Advanced Laser Applications Main research foci of CALA Contact:

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    Source URL: www.munich-photonics.de

    Language: English - Date: 2015-08-11 02:51:13
    994J. Phys. Chem. A 2006, 110, Steric Asymmetry in Electron Transfer from Potassium Atoms to Oriented Nitromethane (CH3NO2) Molecules

    J. Phys. Chem. A 2006, 110, Steric Asymmetry in Electron Transfer from Potassium Atoms to Oriented Nitromethane (CH3NO2) Molecules

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    Source URL: python.rice.edu

    Language: English - Date: 2008-12-09 15:58:22
      995Procurement The high-value manufacturing that the Tokyo Electron Group strives for is based on the functions of all materials and components that make up the products and the pursuit of high quality. We value communicati

      Procurement The high-value manufacturing that the Tokyo Electron Group strives for is based on the functions of all materials and components that make up the products and the pursuit of high quality. We value communicati

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      Source URL: www.tel.com

      Language: English - Date: 2015-08-31 02:31:26
        996RAPID COMMUNICATIONS  PHYSICAL REVIEW C 85, RWeak charge form factor and radius of 208 Pb through parity violation in electron scattering C. J. Horowitz*

        RAPID COMMUNICATIONS PHYSICAL REVIEW C 85, RWeak charge form factor and radius of 208 Pb through parity violation in electron scattering C. J. Horowitz*

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        Source URL: hallaweb.jlab.org

        Language: English - Date: 2012-03-26 14:47:48
          997Electron Markets DOIs12525GENERAL RESEARCH  Detecting incorrect product names in online sources

          Electron Markets DOIs12525GENERAL RESEARCH Detecting incorrect product names in online sources

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          Source URL: cocoa.ethz.ch

          Language: English - Date: 2014-07-08 03:18:46
            998Electron Antineutrinos at DUSEL

            Electron Antineutrinos at DUSEL

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            Source URL: geoscience.lngs.infn.it

            Language: English - Date: 2010-10-06 05:31:16
              999Electron transfer collisions with spatially oriented CH CN 3 Sean A. Harris, Peter W. Harland*¤ and Philip R. Brooks* Chemistry Department and Rice Quantum Institute, Rice University, Houston, T X, 77251, USA Received 1

              Electron transfer collisions with spatially oriented CH CN 3 Sean A. Harris, Peter W. Harland*¤ and Philip R. Brooks* Chemistry Department and Rice Quantum Institute, Rice University, Houston, T X, 77251, USA Received 1

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              Source URL: python.rice.edu

              Language: English - Date: 2008-12-09 15:58:24
                1000Optics / Microscopy / Academia / Science and technology / Electromagnetism / Nanomaterials / Microscopes / Confocal microscopy / Nanophotonics / Electron microscope / Metamaterial / Confocal

                Postdoctoral Researcher in Nano-optics and Nano-biotechnology : Notre Dame, IN, United States Seeking a Ph.D. to support research at the University of Notre Dame in nano-optics and nano-biotechnology. Projects involve op

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                Source URL: postdocs.nd.edu

                Language: English - Date: 2015-03-18 16:08:13