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Dylan
Results: 1009

#	Item
691	Wideband Frequency-Domain Characterization of High-Impedance Probes Uwe Arz, Howard C. Reader1, Pavel Kabos, Dylan F. Williams National Institute of Standards and Technology 325 Broadway, Boulder, CO 80305, USA Add to Reading List Source URL: www.eeel.nist.gov Language: English - Date: 2002-02-13 12:51:24 Electronics Electromagnetism Laboratory equipment Test probe Radio electronics Scattering parameters Oscilloscope Attenuator Calibration Technology Measuring instruments Electronic test equipment
692	An Optimal Multiline TRL Calibration Algorithm* Dylan F. Williams1, C. M. Wang1, and Uwe Arz2 1 2 Add to Reading List Source URL: www.eeel.nist.gov Language: English - Date: 2003-09-23 14:11:47 Electronic engineering Scattering parameters Calibration Normal distribution Network analyzer Cosmic distance ladder Least squares Statistics Regression analysis Measurement
693	Comments on “Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances” Dylan F. Williams, IEEE Senior Member and Roger B. Marks, IEEE Senior Member National Instit Add to Reading List Source URL: www.eeel.nist.gov Language: English - Date: 1998-03-15 16:38:28 Physical quantities Electrical engineering Filter theory Electronic design Electronic test equipment Scattering parameters Smith chart Transmission line Characteristic impedance Electronic engineering Electromagnetism Electronics
694	Characteristic Impedance of Microstrip on Silicon Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]) Add to Reading List Source URL: www.eeel.nist.gov Language: English - Date: 1999-08-10 15:40:12 Signal cables Physical quantities Cables Telecommunications engineering Microstrip Electronic design Transmission line Characteristic impedance Electrical impedance Electronic engineering Electromagnetism Electronics
695	Characteristic Impedance, Causality, and Microwave Circuit Theory Dylan F. Williams and Bradley K. Alpert National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+1] ( Add to Reading List Source URL: www.eeel.nist.gov Language: English - Date: 1999-08-10 15:40:13 Telecommunications engineering Physical quantities Wave mechanics Electrical components Waveguide Z0 Transmission line Hilbert transform Electrical impedance Electromagnetism Electronic engineering Physics
696	IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 53, NO. 4, APRIL[removed]Linearization of Large-Signal Scattering Functions Jan Verspecht, Senior Member, IEEE, Dylan F. Williams, Fellow, IEEE, Dominique Sch Add to Reading List Source URL: www.eeel.nist.gov Language: English - Date: 2005-04-20 18:39:39 Radio electronics Analog circuits Electronic test equipment Laboratory equipment Electrical engineering Small-signal model Scattering parameters Amplifier Large-signal model Electronic engineering Electronics Electromagnetism
697	Lumped-Element Impedance Standards Dylan F. Williams and David K. Walker National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boulde Add to Reading List Source URL: www.eeel.nist.gov Language: English - Date: 1998-03-15 16:38:52 Physical quantities Measuring instruments Electronic test equipment Laboratory equipment Calibration Measurement Electrical reactance Scattering parameters Electrical impedance Electronic engineering Electronics Electromagnetism
698	A Bayesian Approach to Crystal Structure Refinement Dylan Quintana Carnegie Mellon University / NIST Center for Neutron Research Add to Reading List Source URL: www.ncnr.nist.gov - Date: 2014-01-15 16:28:23
699	Transcriptome-Mining for Single-Copy Nuclear Markers in Ferns Carl J. Rothfels1,2, Anders Larsson3, Fay-Wei Li1, Erin M. Sigel1, Layne Huiet1, Dylan O. Burge4, Markus Ruhsam5, Sean W. Graham4, Dennis W. Stevenson6, Gane Add to Reading List Source URL: pryerlab.biology.duke.edu Language: English* - Date: 2013-10-09 14:05:43 Botany Polypodiales Molecular biology Gleicheniales Fern Cystopteridaceae Lindsaeaceae Gene duplication Eupolypods II Biology Pteridopsida Plant taxonomy
700	Causality and Waveguide Circuit Theory Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fa Add to Reading List Source URL: www.eeel.nist.gov Language: English - Date: 1999-06-21 19:27:49 Physical quantities Electrical components Electronic design Cables Telecommunications engineering Electrical impedance Transmission line Wave impedance Waveguide Electronic engineering Electromagnetism Physics

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