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Semiconductors / Molecular electronics / Organic electronics / Display technology / Semiconductor device fabrication / Thin-film transistor / Negative bias temperature instability / Hot carrier injection / AMOLED / Electronics / Electromagnetism / Technology


P-6: Static Reliability of Bridged-Grain Poly-Si TFTs
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Document Date: 2014-10-10 03:11:49

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File Size: 3,21 MB

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