<--- Back to Details
First PageDocument Content
Sawed-off shotgun / Firearm / Deadly weapon / Politics of the United States / Gun laws in the United States / Spud gun legality / Law / Gun politics / Destructive device
Date: 2012-04-09 17:22:10
Sawed-off shotgun
Firearm
Deadly weapon
Politics of the United States
Gun laws in the United States
Spud gun legality
Law
Gun politics
Destructive device

MEMORANDUM TO: UGA Faculty, Staff, and Students FROM:

Add to Reading List

Source URL: www.police.uga.edu

Download Document from Source Website

File Size: 38,82 KB

Share Document on Facebook

Similar Documents

Biochemistry / Protein methods / Bioluminescence / Dyes / Fluorescence / Green fluorescent protein / Genetically modified organism / Biology / Chemistry / Molecular biology

GFPIII Meter Fluorescent Protein Meter A hand-held device for the non-destructive determination of green fluorescent protein and other fluorescent protein compounds  Non-destructive

DocID: 18z6d - View Document

ADC Bioscientific / Measuring instrument / Photosynthetic pigments / Chlorophyll / Tetrapyrroles

CCM-200 plus Chlorophyll Content Meter A lightweight hand-held device for the accurate and easy determination of chlorophyll content  Non-destructive  Accurate, reliable and proven

DocID: 18i0A - View Document

Biochemistry / Anthocyanin / Photoinhibition / Biological pigment / Flavonoid / Measuring instrument / Universal Serial Bus / Berry / ADC Bioscientific / Chemistry / Biology / Phenolic compounds in wine

ACM-200plus Anthocyanin Content Meter A hand-held device for the non-destructive determination of anthocyanin content in leaves and flowers  Non-destructive

DocID: 182Yp - View Document

Tsukuba /  Ibaraki / Photon Factory / Beamline / Synchrotron / DESY / SPring-8 / Insertion device / Particle physics / Diamond Light Source / Physics / Particle accelerators / KEK

Introduction The fiscal year 2010 was an extraordinary year for the Photon Factory. The immensely destructive earthquake on March 11, 2011 and the events which followed have left far reaching effects. Although this Annua

DocID: 17Wow - View Document

Physics / Technology / MOSFET / Capacitance / Depletion region / Diode / P–n junction / Capacitor / Field-effect transistor / Scanning probe microscopy / Scanning capacitance microscopy / Electromagnetism

Mode Note Scanning Capacitance Microscopy (SCM) High Resolution and High Sensitivity Imaging of Charge Distribution Characterization of Semiconductor Device with Non-Destructive Technique and High Spatial Resolution

DocID: 17Hg8 - View Document