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Advanced IC Process Characterization Tool Puts Reliability Data in Hands of Fabless Design Houses ProChek™ Measures Critical DSM Degradation Effects in Hours, Not Weeks Anaheim, California, September 19, Ridget
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Document Date: 2015-07-18 01:30:10
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Advanced IC Process Characterization Tool Puts Reliability Data in Hands of Fabless Design Houses ProChek™ Measures Critical DSM Degradation Effects in Hours, Not Weeks Anaheim, California, September 19, Ridget