Call for Papers International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design- fortest, design

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Date: 2015-10-25 02:05:23 Engineering Design Education Design for X Electronics manufacturing Test engineer Post-silicon validation Test Reliability engineering Turing test		Call for Papers International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design- fortest, design Add to Reading List Source URL: itctestweek.org Download Document from Source Website File Size: 144,68 KB Share Document on Facebook

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