Microsoft Word - IOLTS09-Final-Program.doc - Dependability - Document - PDFSEARCH.IO

First Page		Document Content
Date: 2009-06-08 03:59:34 Systems engineering Quality Safety engineering Engineering INESC Porto Reliability engineering Fault injection Single event upset Dependability Electronic engineering Technology Electronics		Microsoft Word - IOLTS09-Final-Program.doc Add to Reading List Source URL: tima.imag.fr Download Document from Source Website File Size: 276,10 KB Share Document on Facebook

	SINGLE EVENT EFFECTS ON COMMERCIAL SRAMS AND POWER MOSFETS: FINAL RESULTS OF THE CRUX FLIGHT EXPERIMENT ON APEX1 Janet L. Barth NASA/Goddard Space Flight Center DocID: 1p3If - View Document
	The Need for Harsh Environment Electronic Systems in the UK Aerospace System Pillar Rolls-Royce Controls and Data Services Limited Steve Dennison Chief of Component Strategy Greg Wells DocID: 1ndPW - View Document
	The Need for Harsh Environment Electronic Systems in the UK Aerospace System Pillar Rolls-Royce Controls and Data Services Limited Steve Dennison Chief of Component Strategy Greg Wells DocID: 1mDLv - View Document
	Application Note Physical 3D Single Event Upset Simulation of a SRAM Cell with VICTORY and SmartSpice SEE Introduction DocID: 1lhzt - View Document
	ISS SPACE RADIATION EFFECTS AND EXPERIENCE: UTILIZATION FOR CURRENT AND FUTURE EXPLORATION PROGRAMS Bill Atwell - Boeing Research & Technology, Houston ,TX Steve Koontz - NASA, Johnson Space Center, Houston, TX Eugene No DocID: 1fHAh - View Document