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Defect
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#	Item
11	1 Comments on “Researcher Bias: The Use of Machine Learning in Software Defect Prediction” Chakkrit Tantithamthavorn, Student Member, IEEE, Add to Reading List Source URL: chakkrit.com Language: English - Date: 2018-07-19 22:33:26
12	Determination of absolute defect concentrations for saturated positron trapping polycrystalline Ni as a case study R. Krause-Rehberg1, V. Bondarenko1, E. Thiele2, R. Klemm2 Sample Conditions Introduction - In case of sat Add to Reading List Source URL: positron.physik.uni-halle.de Language: English - Date: 2006-06-15 12:02:19
13	Langmuir 2008, 24, 11063 Defect Induced Asymmetric Pit Formation on Hydroxyapatite Ki-Young Kwon,† Eddie Wang,† Alice Chung,† Neil Chang,† Eduardo Saiz,‡ Uh-Joo Choe,§ Add to Reading List Source URL: leelab.berkeley.edu Language: English - Date: 2011-01-27 14:16:00
14	Answers Needed constants 1 u = 1.66 xkg 1eV = 1.602 x 10-19J Solution 1.1 Mass defect Add to Reading List Source URL: ijso2013.hbcse.tifr.res.in Language: English - Date: 2013-09-12 16:58:59
15	SOFTWARE MANANGEMENT TWO Software Defect Reduction Add to Reading List Source URL: www.cs.umd.edu Language: English - Date: 2001-01-09 14:33:48
16	Oxygen defect structure of oxygen ionic and electronic mixed conductive oxides at high temperatures Kagomiya I, Kinoshita T., Kakimoto K. and Ohsato H. Nagoya Institute of Technology Single crystals of SrFeO3-d were prep Add to Reading List Source URL: quasi.issp.u-tokyo.ac.jp - Date: 2010-12-31 00:08:27
17	V9 series software defect Add to Reading List Source URL: monitouch.fujielectric.com Language: English - Date: 2016-10-27 05:17:17
18	Insulation Defect Locator IDL02 – 2x90-120 DESCRIPTION: The SENIS Insulation Defect Locator IDL02 utilizes two high-sensitivity clamp-on micro-ammeters to measure and track the direct current passing through a defect o Add to Reading List Source URL: c1940652.r52.cf0.rackcdn.com Language: English - Date: 2016-08-25 10:26:58
19	Towards a Better Understanding of the Impact of Experimental Components on Defect Prediction Modelling 1 Chakkrit Tantithamthavorn1 Add to Reading List Source URL: chakkrit.com Language: English - Date: 2018-07-19 22:33:26
20	Predicting material parameters for intrinsic point defect diffusion in Silicon Crystal Growth Michael Griebel1, Lukas Jager2 and Axel Voigt3 1 Institut für Angewandte Mathematik, Universität Bonn, Wegelerstr. 6, 53115 Add to Reading List Source URL: wissrech.ins.uni-bonn.de Language: English - Date: 2015-03-23 14:22:06

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