Defect

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111 Comments on “Researcher Bias: The Use of Machine Learning in Software Defect Prediction” Chakkrit Tantithamthavorn, Student Member, IEEE,

1 Comments on “Researcher Bias: The Use of Machine Learning in Software Defect Prediction” Chakkrit Tantithamthavorn, Student Member, IEEE,

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Source URL: chakkrit.com

Language: English - Date: 2018-07-19 22:33:26
    12Determination of absolute defect concentrations for saturated positron trapping polycrystalline Ni as a case study R. Krause-Rehberg1, V. Bondarenko1, E. Thiele2, R. Klemm2 Sample Conditions Introduction - In case of sat

    Determination of absolute defect concentrations for saturated positron trapping polycrystalline Ni as a case study R. Krause-Rehberg1, V. Bondarenko1, E. Thiele2, R. Klemm2 Sample Conditions Introduction - In case of sat

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    Source URL: positron.physik.uni-halle.de

    Language: English - Date: 2006-06-15 12:02:19
      13Langmuir 2008, 24, 11063 Defect Induced Asymmetric Pit Formation on Hydroxyapatite Ki-Young Kwon,† Eddie Wang,† Alice Chung,† Neil Chang,† Eduardo Saiz,‡ Uh-Joo Choe,§

      Langmuir 2008, 24, 11063 Defect Induced Asymmetric Pit Formation on Hydroxyapatite Ki-Young Kwon,† Eddie Wang,† Alice Chung,† Neil Chang,† Eduardo Saiz,‡ Uh-Joo Choe,§

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      Source URL: leelab.berkeley.edu

      Language: English - Date: 2011-01-27 14:16:00
        14Answers Needed constants 1 u = 1.66 xkg 1eV = 1.602 x 10-19J Solution 1.1 Mass defect

        Answers Needed constants 1 u = 1.66 xkg 1eV = 1.602 x 10-19J Solution 1.1 Mass defect

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        Source URL: ijso2013.hbcse.tifr.res.in

        Language: English - Date: 2013-09-12 16:58:59
          15SOFTWARE MANANGEMENT TWO Software Defect Reduction

          SOFTWARE MANANGEMENT TWO Software Defect Reduction

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          Source URL: www.cs.umd.edu

          Language: English - Date: 2001-01-09 14:33:48
            16Oxygen defect structure of oxygen ionic and electronic mixed conductive oxides at high temperatures Kagomiya I, Kinoshita T., Kakimoto K. and Ohsato H. Nagoya Institute of Technology Single crystals of SrFeO3-d were prep

            Oxygen defect structure of oxygen ionic and electronic mixed conductive oxides at high temperatures Kagomiya I, Kinoshita T., Kakimoto K. and Ohsato H. Nagoya Institute of Technology Single crystals of SrFeO3-d were prep

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            Source URL: quasi.issp.u-tokyo.ac.jp

            - Date: 2010-12-31 00:08:27
              17V9 series software defect

              V9 series software defect

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              Source URL: monitouch.fujielectric.com

              Language: English - Date: 2016-10-27 05:17:17
                18Insulation Defect Locator IDL02 – 2x90-120 DESCRIPTION: The SENIS Insulation Defect Locator IDL02 utilizes two high-sensitivity clamp-on micro-ammeters to measure and track the direct current passing through a defect o

                Insulation Defect Locator IDL02 – 2x90-120 DESCRIPTION: The SENIS Insulation Defect Locator IDL02 utilizes two high-sensitivity clamp-on micro-ammeters to measure and track the direct current passing through a defect o

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                Source URL: c1940652.r52.cf0.rackcdn.com

                Language: English - Date: 2016-08-25 10:26:58
                  19Towards a Better Understanding of the Impact of Experimental Components on Defect Prediction Modelling 1 Chakkrit Tantithamthavorn1

                  Towards a Better Understanding of the Impact of Experimental Components on Defect Prediction Modelling 1 Chakkrit Tantithamthavorn1

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                  Source URL: chakkrit.com

                  Language: English - Date: 2018-07-19 22:33:26
                    20Predicting material parameters for intrinsic point defect diffusion in Silicon Crystal Growth Michael Griebel1, Lukas Jager2 and Axel Voigt3 1 Institut für Angewandte Mathematik, Universität Bonn, Wegelerstr. 6, 53115

                    Predicting material parameters for intrinsic point defect diffusion in Silicon Crystal Growth Michael Griebel1, Lukas Jager2 and Axel Voigt3 1 Institut für Angewandte Mathematik, Universität Bonn, Wegelerstr. 6, 53115

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                    Source URL: wissrech.ins.uni-bonn.de

                    Language: English - Date: 2015-03-23 14:22:06