Corporate Fact Sheet Overview Founded in 1987, Parasoft researches and develops software solutions that help organizations deliver defect-free software efficiently. By integrating development testing, API testing, and s

Source URL: www.parasoft.com

• Software engineering
• Software testing
• Software
• Parasoft
• Adam Kolawa
• API testing
• Continuous testing
• Unit testing
• Development testing
• Load testing
• Test automation
• Requirements traceability

A Defect-Tolerant Accelerator for Emerging High-Performance Applications Olivier Temam INRIA Saclay, France Abstract

Source URL: pages.saclay.inria.fr

On the linearity defect of the residue field Liana S ¸ ega University of Missouri, Kansas City October 16, 2011

Source URL: www.math.unl.edu

Growth of vertical and defect free InP nanowires on SrTiO3(001) substrate and comparison with growth on silicon

Source URL: zwillerlab.tudelft.nl

Letter pubs.acs.org/NanoLett Ultraclean Emission from InAsP Quantum Dots in Defect-Free Wurtzite InP Nanowires Dan Dalacu,*,† Khaled Mnaymneh,† Jean Lapointe,† Xiaohua Wu,† Philip J. Poole,† Gabriele Bulgarini,

Source URL: zwillerlab.tudelft.nl

Analyzing the Impact of ISO on Digital Imager Defects with an Automated Defect Trace Algorithm Jenny Leunga, Glenn H. Chapman*a, Yong H. Choia, Rohit Thomasa, Zahava Korenb, Israel Korenb a School of Engineering Science

Source URL: euler.ecs.umass.edu

• Digital photography
• Imaging
• Image sensors
• Photography
• Digital imaging
• Image processing
• Defective pixel
• Image noise
• Image sensor format
• Digital camera
• Charge-coupled device
• Pixel

DEFECT DEFINITIONS PINCH MARKS DIE LINE

Source URL: www.buypmc.com

Institute of Electronic Materials Technology Joint Laboratory for Characterisation of Defect Centres in Semi-Insulating Materials High-resolution photoinduced transient spectroscopy of radiation defect centres in silicon

Source URL: wwwiexp.desy.de

“Non-traditional methods of material properties and defect parameters measurement Juozas Vaitkus on behalf of a few Vilnius groups Vilnius University, Lithuania

Source URL: wwwiexp.desy.de

Empirical Evaluation of Defect Projection Models for Widely-deployed Production Software Systems Paul Luo Li, Mary Shaw, Jim Herbsleb, Bonnie Ray*, and P. Santhanam* August 2004

Source URL: reports-archive.adm.cs.cmu.edu