SEU Mitigation for Stratix V Devices

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Date: 2014-07-02 07:29:40 Data quality Embedded systems Computing Electronics manufacturing Joint Test Action Group Cyclic redundancy check Field-programmable gate array Error detection and correction Single event upset Electronic engineering Electronics Digital electronics		SEU Mitigation for Stratix V Devices Add to Reading List Source URL: www.altera.com Download Document from Source Website File Size: 676,24 KB Share Document on Facebook

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