APPLIED PHYSICS LETTERS VOLUME 85, NUMBER 3 19 JULY 2004

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Date: 2006-11-26 20:31:09 Materials science Condensed matter physics Electrical phenomena Transducers Thin film deposition Piezoresponse force microscopy Piezoelectricity Ferroelectricity Microelectromechanical systems Electromagnetism Physics Semiconductor device fabrication		APPLIED PHYSICS LETTERS VOLUME 85, NUMBER 3 19 JULY 2004 Add to Reading List Source URL: daedalus.caltech.edu Download Document from Source Website File Size: 243,05 KB Share Document on Facebook

	data sheet IssuedattoAFM I low temperature atomic force microscope, interferometric sensor DocID: 1qYWt - View Document
	) Xue Feng,†,#,* Byung Duk Yang,‡,# Yuanming Liu,§ Yong Wang,† Canan Dagdeviren,‡ Zhuangjian Liu,^ Andrew Carlson,‡ Jiangyu Li,§ Yonggang Huang, and John A. Rogers‡,z,* ARTICLE DocID: 1oTVo - View Document
	Application Note 083 Piezoresponse Force Microscopy in Its Applications • Ferrroelectric domains imaging • Hysteresis loops measurements DocID: 1nsC7 - View Document
	Application Note 083 Piezoresponse Force Microscopy in Its Applications • Ferrroelectric domains imaging • Hysteresis loops measurements DocID: 1n9ET - View Document
	Investigation of ferroelectric domains with scanning probe microscope DocID: 1fs7J - View Document