Panu Ylihaavisto Nokia Corporation / Matsushita / Panasonic / Hironori Handa JST Mfg. / Kai Silvennoine Nokia Corporation / Force Test Group / Jan Fahllund Nokia Corporation / Sheldon Singleton National Technical Systems / Richard Petrie Nokia Corporation / Cable & Connector Work Group / Connectors Class Document Yoichi Nakazawa JST Mfg. / Jussi Takaneva Nokia Corporation / Address James R. Koser Foxconn Electronics / Tsuneki Watanabe Foxconn Electronics / Scott Shuey Tyco Electronics / Underwriters Laboratories / / /
EntertainmentAwardEvent
Jussi / /
Event
FDA Phase / Product Issues / /
Facility
Laboratory Accreditation / Electronic Test Center / /
IndustryTerm
Web site http /
Organization
Electronic Industries Association / American Society for Testing and Materials / ASTM American Society for Testing and Materials / IF / American Association for Laboratory Accreditation / Related Documents American Society for Testing / Electronic Test Center / /
Person
Jim Koser / Glen Chandler Acon / Sam Liu Newnex / Toshi Sasaki Honda Connectors / Satoshi Yamamoto Panasonic / Naoyuki Ono / Tsuyoshi Kitagawa Hosiden / George Yee Acon George / Eric Yagi / Masaru Ueno / Jim Zhao / Hitoshi Kawamura Mitsumi / Bill Northey / Ron Muir / Yasuhiko Shinohara Mitsumi / Mark Paxson / E. Mark Rodda / Scott Sommers / George G. Olear II / Atsushi Nishio Mitsumi / Jim Eilers Hosiden / Tsuyoshi Yamane Panasonic / Vincent Chen Longwell / /
Position
CCWG Chair / General / Co-Editor / /
Product
Logo / USB / Unit / /
ProgrammingLanguage
RC / /
Technology
Universal Serial Bus / Dielectric / Co-Editor ggo@contechresearch.com Jaremy Flake ATL Technology / /
Universal Serial Bus Cables and Connectors Class Document Revision 2.0 August 2007