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Scanning electron microscope / Electron microscope / Transmission electron microscopy / Microscope / Cathodoluminescence / Microscopy / Environmental scanning electron microscope / Scanning transmission electron microscopy / Scientific method / Science / Electron microscopy


MAM18~6! 23/12
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Document Date: 2013-07-31 11:10:01


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City

Hamamatsu City / Peabody / London / New York / /

Company

Epoxy Technology Inc. / Schlumberger / Cambridge University Press / JEOL USA Inc. / Plenum Press / Xing / Vernon E. Robertson JEOL USA Inc. / Ge / Oxford Instruments / /

Country

Japan / United States / United Kingdom / /

/

IndustryTerm

detection systems / oil and gas industry / metal phase ~for instance / electron microscope technology / particular tool / low voltage imaging / backscatter imaging / ultralow voltage imaging / internal and interfacial pore networks / basic high-resolution imaging / nondispersive systems / improved backscatter imaging / collection systems / imaging / remarkable chemical / energy / /

Organization

Cambridge University / Research Center / Canadian Society / MICROSCOPY SOCIETY OF AMERICA / Society of Petroleum Engineers / /

Person

Nick Drenzek / Charles Nielsen / /

Position

*Corresponding author / Cross-Section Polisher / polisher / researcher / /

ProgrammingLanguage

C / /

ProvinceOrState

Massachusetts / /

Technology

radiation / scanning electron microscope technology / X-ray / simulation / /

SocialTag