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Integrated circuits / Automatic test pattern generation / Linear-feedback shift register / Built-in self-test / Scan chain / Hardware Trojan


Low Power MSIC Signatures for Effective BIST Design Chekka Narasimha Rao M.Tech Student, Audi Sankara Institute of Technology, NH-5 Bypass Road, East Gudur Rural, Andrapradesh
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Document Date: 2015-01-10 06:34:49


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File Size: 581,93 KB

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