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Electronic engineering / Joint Test Action Group / Boundary scan / Altera / Field-programmable gate array / Shift register / Boundary scan description language / Serial Vector Format / Electronics manufacturing / Manufacturing / Electronics


AN 39: IEEE[removed]JTAG Boundary-Scan Testing in Altera Devices
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Document Date: 2010-05-05 19:29:24

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File Size: 264,44 KB

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